Dependence of superconducting layer thickness on critical current density of IBAD/CVD-processed YBCO coated conductors

被引：3

作者：

Himeki, K. ^{[1
]}

Kiuchi, M. ^{[1
]}

Otabe, E. S. ^{[1
]}

Matsushita, T. ^{[1
]}

Shikimachi, K. ^{[2
]}

Watanabe, T. ^{[2
]}

Kashima, N. ^{[2
]}

Nagaya, S. ^{[2
]}

Yamada, Y. ^{[3
]}

Shiohara, Y. ^{[3
]}

机构：

[1] Kyushu Inst Technol, Fac Comp Sci & Syst Engn, Fukuoka 8208502, Japan

[2] Chubu Elect Power Co Inc, Midori Ku, Nagoya, Aichi 4598522, Japan

[3] Superconduct Res Lab, Koto Ku, Tokyo 1350062, Japan

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2009年 / 469卷 / 15-20期

关键词：

YBCO; IBAD; CVD; Thickness; Flux creep-flow model;

D O I：

10.1016/j.physc.2009.05.064

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The thickness dependence of the critical current characteristics was investigated for YBa2Cu3O7-delta (YBCO) coated conductors fabricated by Ion Beam Assist Deposition (IBAD)/Chemical Vapor Deposition (CVD) method in the range of 0.18-0.90 pm to find out the optimum thickness for various applications. The transport and magnetization critical current densities were estimated using the electric field criterion of E-c = 1.0 x 10(-4) V/m and E-c = 1.0 x 10(-9) V/m, respectively. The critical current density decreased with increase thickness in the low magnetic field region in the both electric field region because of the structural degradation of superconducting layer. This decreasing rate was lower than in Pulsed Laser Deposition (PLD)-processed YBCO coated conductors. It is found that the thickness dependence of irreversibility field B-i differed between the low and normal electric field region. In the low electric field region, B-i increased with increasing thickness. On the other hand, B-i is almost independent of the thickness in the normal electric field region. The thickness dependence of B-i was also superior to that of PLD-processed YBCO coated conductors. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1457 / 1461

页数：5

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