Optical phasing method based on scanning white-light interferometry for multi-aperture optical telescopes

被引:6
|
作者
Li, Yang [1 ,2 ]
Wang, Sheng-Qian [1 ,2 ]
机构
[1] Chinese Acad Sci, Key Lab Adapt Opt, Chengdu 610209, Peoples R China
[2] Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
基金
中国国家自然科学基金;
关键词
CAMERA;
D O I
10.1364/OL.415048
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A novel, to the best of our knowledge, sensing approach based on scanning white-light interferometry (SWLI) is proposed to detect piston errors of the multi-aperture optical telescope. The scanning white-light interferometer is composed of a Mach-Zehnder interferometer (MZI) and an optical path modulator (OPM). A lenslet array is used to image the interferometric wavefront between the reference and the other individual apertures. The piston errors can be estimated from these SWLI signals focused by the lenslet array. The measurement range of the proposed method depends on the modulation range of the OPM and can reach millimeter order, and its accuracy is better than a 1/20 wavelength. In addition, the proposed method's amplitude-splitting interferometry of the MZI makes it fit for a multi-aperture optical telescope. We demonstrate a proof of concept and validate the feasibility of our proposed phasing method. (C) 2021 Optical Society of America
引用
收藏
页码:793 / 796
页数:4
相关论文
共 50 条
  • [31] 3D Measurement of TSVs Using Low Numerical Aperture White-Light Scanning Interferometry
    Jo, Taeyong
    Kim, Seongryong
    Pahk, Heuijae
    JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2013, 17 (04) : 317 - 322
  • [32] White-light spectral interferometry used to measure dispersion characteristics of optical fibers
    Hlubina, P
    Martynkien, T
    Urbanczyk, W
    ICTON 2003: 5TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 2, PROCEEDINGS, 2003, : 106 - 109
  • [33] Artifacts in optical Measurement of Surfaces at the Example of confocal and White-Light Interferometry Sensors
    Lyda, Wolfram
    Mauch, Florian
    Osten, Wolfgang
    4. FACHTAGUNG METROLOGIE IN DER MIKRO- UND NANOTECHNIK 2011: MESSPRINZIPIEN - MESSGERATE - ANWENDUNGEN, 2011, 2133 : 197 - 206
  • [34] Discrete Optical Multi-Aperture Combiner: instrumental concept
    Minardi, Stefano
    Labadie, Lucas
    Lacour, Sylvestre
    OPTICAL AND INFRARED INTERFEROMETRY III, 2012, 8445
  • [35] Characterization of gap-plasmon-based metasurfaces with scanning white-light interferometry
    Akhmedzhanov, I. M.
    Baranov, D., V
    Zavedeev, E., V
    Deshpande, R. A.
    Bozhevolnyi, S., I
    JOURNAL OF OPTICAL TECHNOLOGY, 2022, 89 (07) : 378 - 387
  • [36] HIGH-SPEED NONCONTACT PROFILER BASED ON SCANNING WHITE-LIGHT INTERFEROMETRY
    DECK, L
    DEGROOT, P
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1995, 35 (02): : 147 - 150
  • [37] White-light interferometry: New developments applied to high accuracy optical measurements
    Huard, SJ
    Giovannini, H
    SPECIFICATION, PRODUCTION, AND TESTING OF OPTICAL COMPONENTS AND SYSTEMS, 1996, 2775 : 122 - 127
  • [38] HIGH-SPEED NONCONTACT PROFILER BASED ON SCANNING WHITE-LIGHT INTERFEROMETRY
    DECK, L
    DEGROOT, P
    APPLIED OPTICS, 1994, 33 (31): : 7334 - 7338
  • [39] APPLICATIONS OF MULTI-APERTURE WHITE LIGHT SPECKLE PHOTOGRAPHY.
    Mohan, N.Krishna
    Joenathan, C.
    Sharma, D.K.
    Sirohi, R.S.
    Optik (Jena), 1987, 76 (01): : 7 - 11
  • [40] The curvature profile measurement using White-light scanning interferometry
    Kwon, YongKwan
    Heo, EunChang
    Kim, ByoungChang
    2007 INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS, VOLS 1-6, 2007, : 1118 - +