Dope depth distribution in rapidly solidified Al-Ge and Al-Me (Me=Fe, Cu, Sb) alloys

被引:15
作者
Tashlykova-Bushkevich, II [1 ]
Shepelevich, VG [1 ]
机构
[1] Byelorussian State Univ, Dept Solid State Phys, Minsk 220080, BELARUS
关键词
rapid solidification; aluminium alloys; RBS measurements; depth distribution;
D O I
10.1016/S0925-8388(99)00750-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A detailed dope depth distribution investigation in rapidly solidified (RS) foils of Al alloys has been made using the Rutherford backscattering spectroscopy technique. We found that at the foil surface (0.04-0.06 mu m) the dope concentration exceeds the experimental measured concentration. We also found that the Me concentration oscillates through the thickness of the investigated layers. However, in the RS Al-Ge alloy no dope oscillation was detected. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
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页码:205 / 207
页数:3
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