共 12 条
- [2] BAI DS, 1993, NAV RES LOG, V40, P193, DOI 10.1002/1520-6750(199303)40:2<193::AID-NAV3220400205>3.0.CO
- [3] 2-J
- [5] ELSAYED EA, 2004, P 2 IIEC 2004 DEC 19
- [6] Optimum 3-step step-stress tests [J]. IEEE TRANSACTIONS ON RELIABILITY, 1996, 45 (02) : 341 - 345
- [8] A new model for step-stress testing [J]. IEEE TRANSACTIONS ON RELIABILITY, 1998, 47 (02) : 131 - 134