Atomic Force Microscopy Simulation by MD/Continuum Coupling Method

被引:1
|
作者
Senda, Yasuhiro [1 ]
Imahashi, Nobuyuki [1 ]
Shimamura, Shuji [1 ]
Blomqvist, Janne [2 ]
Nieminen, Risto [2 ]
机构
[1] Yamaguchi Univ, Dept Appl Sci, Yamaguchi 7558611, Japan
[2] Aalto Univ, Dept Appl Phys, COMP Ctr Excellence, Aalto 00076, Finland
基金
芬兰科学院; 日本学术振兴会;
关键词
Molecular dynamics; coupling method; atomic force microscopy; energy dissipation; ENERGY-DISSIPATION;
D O I
10.1080/10584587.2014.905108
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have performed atomic force microscopy (AFM) simulations to understand the microscopic mechanism of an AFM experiment, especially the observed energy dissipation. The oscillation of a cantilever in AFM is described by spring motion, and the atomic interaction between the tip attached on cantilever and surface is calculated by the molecular dynamics (MD) method. In order to couple the spring motion with the atomic dynamics, we use the MD/continuum coupling method which was developed by our group. We propose a simple computational model using Lennard Jones interatomic potential. As the spring approaches the surface, the atomic interaction between the tip and surface increases and it perturbs harmonic oscillation of the spring with the frequency shifted and the amplitude damped. The kinetic energy of the spring is transferred to the atoms on the surface. It is shown that this energy dissipation comes from two atomic processes: irreversible atomic dynamics and atomic thermal fluctuation.
引用
收藏
页码:33 / 38
页数:6
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