Structural characteristics of lead-zirconate-titanate piezoelectric films around morphotropic phase boundary

被引：0

作者：

Leppavuori, S ^{[1
]}

Uusimaki, A ^{[1
]}

Zhang, HX ^{[1
]}

机构：

[1] UNIV OULU,PHYS MAT LAB,FIN-90570 OULU,FINLAND

来源：

FERROELECTRICS | 1997年 / 195卷 / 1-4期

关键词：

D O I：

10.1080/00150199708260488

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The structural characteristics of Lead-zirconate-titanate solid solution around the Morphotropic Phase Boundary was investigated using X-ray diffractometry and Raman spectroscopy. The rhombohedral-tetragonal transformation was induced by firing the screen-printed PZT thick films between 960 degrees C and 1200 degrees C or annealing the laser-ablated PZT thin films between 500 degrees C and 900 degrees C. During the processing, lead was gradually evaporated, causing the composition of films moved from the original rhombohedral region to the tetragonal region. The XRD measurements showed the transformation starting at about 1000 degrees C for the thick films and about 900 degrees C for the thin films. But the Raman measurements show different results. This discrency indicates certain particular aspects of this transformation which are interpreted in a non-equilibrium displacement model.

引用

页码：59 / 63

页数：5

共 12 条

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