CFAR Detector Based on Goodness-of-Fit Tests

被引:0
作者
Deng, Xiaobo [1 ]
Pi, Yiming [1 ]
Cao, Zhenglin [2 ]
机构
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China
[2] China Aviat Ind Corp I, Radar & Avion Inst, Wuxi 214063, Peoples R China
基金
国家高技术研究发展计划(863计划); 美国国家科学基金会;
关键词
constant false alarm rate (CFAR) detection; goodness-of-fit test; location-scale distribution; Weibull distribution; lognormal distribution; ORDER-STATISTICS CFAR; CLUTTER;
D O I
10.1587/transcom.E92.B.2209
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper develops a complete architecture for constant false alarm rate (CFAR) detection based on a goodness-of-fit (GOF) test. This architecture begins with a logarithmic amplifier, which transforms the background distribution, whether Weibull or lognormal into a location-scale (LS) one, some relevant properties of which are exploited to ensure CFAR. A GOF test is adopted at last to decide whether the samples under test belong to the background or are abnormal given the background and so should be declared to be a target of interest. The performance of this new CFAR scheme is investigated both in homogeneous and multiple interfering targets environment.
引用
收藏
页码:2209 / 2217
页数:9
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