共 20 条
Adhesion enhancement of diamond coating on minor Al-modified copper substrate
被引:19
作者:

Li, X. J.
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机构:
Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

Li, Y. S.
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机构:
Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

Pan, T. J.
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h-index: 0
机构:
Changzhou Univ, Dept Mat Sci & Engn, Changzhou 213164, Peoples R China Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

Yang, L. Z.
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h-index: 0
机构:
Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

He, L. L.
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h-index: 0
机构:
Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

Yang, Q.
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h-index: 0
机构:
Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

Hirose, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Saskatchewan, Plasma Phys Lab, Saskatoon, SK S7N 5E2, Canada Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
机构:
[1] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
[2] Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada
[3] Changzhou Univ, Dept Mat Sci & Engn, Changzhou 213164, Peoples R China
[4] Univ Saskatchewan, Plasma Phys Lab, Saskatoon, SK S7N 5E2, Canada
基金:
加拿大自然科学与工程研究理事会;
关键词:
Diamond;
Copper;
CVD;
Adhesion;
Alloying modification;
CVD DIAMOND;
FILMS;
GROWTH;
GRAPHENE;
ALLOYS;
CU;
D O I:
10.1016/j.diamond.2014.03.001
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
We report on the enhanced interfacial adhesion of diamond coating on copper substrate modified by a small fraction of Al. For pure copper substrate, the diamond coating formed tends to crack and delaminate, primarily caused by a slight accumulation of detrimental graphite intermediate layer and thermal stress induced by mismatch of the coefficients of thermal expansion. Additions of 1 and 3 at.% Al to the copper substrate gradually decrease the intermediate graphitic phase. At the higher Al concentration, an aluminium oxide forms at the coating-substrate interface, and graphitic/amorphous carbon is completely inhibited, leading to significantly enhanced interfacial adhesion of diamond coating. The electron structure of copper is not observed to significantly alter on this Cu-Al dilute alloy. The alumina barrier layer preferentially formed on copper surface is believed to play a key role in preventing graphitization and adhesion enhancement. (C) 2014 Elsevier B.V. All rights reserved.
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页码:1 / 6
页数:6
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