MacLeR: Machine Learning-Based Runtime Hardware Trojan Detection in Resource-Constrained IoT Edge Devices

被引:11
|
作者
Khalid, Faiq [1 ]
Hasan, Syed Rafay [2 ]
Zia, Sara [3 ]
Hasan, Osman [3 ]
Awwad, Falah [4 ]
Shafique, Muhammad [5 ,6 ]
机构
[1] Tech Univ Wien, Inst Comp Engn, A-1040 Vienna, Austria
[2] Tennessee Technol Univ, Elect & Comp Engn Dept, Cookeville, TN 38505 USA
[3] Natl Univ Sci & Technol, Sch Elect Engn & Comp Sci, Islamabad 44000, Pakistan
[4] UAE Univ, Coll Engn, Dept Elect Engn, Al Ain, U Arab Emirates
[5] New York Univ Abu Dhabi, Div Engn, Abu Dhabi, U Arab Emirates
[6] Tech Univ Wien, A-1040 Vienna, Austria
关键词
Hardware security; hardware trojans; LEON3; machine learning; microprocessor; power profiling;
D O I
10.1109/TCAD.2020.3012236
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Traditional learning-based approaches for runtime hardware Trojan (HT) detection require complex and expensive on-chip data acquisition frameworks, and thus incur high area and power overhead. To address these challenges, we propose to leverage the power correlation between the executing instructions of a microprocessor to establish a machine learning (ML)-based runtime HT detection framework, called MacLeR. To reduce the overhead of data acquisition, we propose a single power-port current acquisition block using current sensors in time-division multiplexing, which increases accuracy while incurring reduced area overhead. We have implemented a practical solution by analyzing multiple HT benchmarks inserted in the RTL of a system-on-chip (SoC) consisting of four LEON3 processors integrated with other IPs, such as vga_lcd, RSA, AES, Ethernet, and memory controllers. Our experimental results show that compared to state-of-the-art HT detection techniques, MacLeR achieves 10% better HT detection accuracy (i.e., 96.256%) while incurring a 7x reduction in area and power overhead (i.e., 0.025% of the area of the SoC and < 0.07% of the power of the SoC). In addition, we also analyze the impact of process variation (PV) and aging on the extracted power profiles and the HT detection accuracy of MacLeR. Our analysis shows that variations in fine-grained power profiles due to the HTs are significantly higher compared to the variations in fine-grained power profiles caused by the PVs and aging effects. Moreover, our analysis demonstrates that on average, the HT detection accuracy drops in MacLeR is less than 1% and 9% when considering only PV and PV with worst case aging, respectively, which is similar to 10x less than in the case of the state-of-the-art ML-based HT detection technique.
引用
收藏
页码:3748 / 3761
页数:14
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