WSe(2-x)Tex alloys grown by molecular beam epitaxy

被引:21
作者
Barton, Adam T. [1 ]
Yue, Ruoyu [1 ]
Walsh, Lee A. [1 ,2 ]
Zhou, Guanyu [1 ]
Cormier, Christopher [1 ]
Smyth, Christopher M. [1 ]
Addou, Rafik [1 ]
Colombo, Luigi [1 ]
Wallace, Robert M. [1 ]
Hinkle, Christopher L. [1 ,3 ]
机构
[1] Univ Texas Dallas, 800 W Campbell Rd, Richardson, TX 75080 USA
[2] Univ Coll Cork, Tyndall Natl Inst, Cork, Ireland
[3] Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA
来源
2D MATERIALS | 2019年 / 6卷 / 04期
基金
美国国家科学基金会;
关键词
mixed chalcogen alloys; WSe2; WTe2; phase change; phase separation; STANDARD MOLAR ENTHALPY; RAMAN-SCATTERING; MONOLAYER MOS2; LARGE-AREA; WSE2; PHOTOLUMINESCENCE; OPTOELECTRONICS; VAPORIZATION; SELENIUM;
D O I
10.1088/2053-1583/ab334d
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growth of WSe(2-x)Tex alloys by molecular beam epitaxy has been demonstrated for the first time to investigate the phase transition from the semiconducting 2H phase to the semi-metallic 1T' phase as a function of Te concentration. Up to 14% Te incorporation, stable alloys in the semiconducting 2H phase are achieved while above 79% Te incorporation, stable alloys in the semi-metallic 1T' phase are obtained. Our results indicate the MBE-grown WSe(2-x)Tex alloys exhibit a miscibility gap from 14% to 79% Te concentrations at a growth temperature of 250 degrees C, a temperature compatible with direct vertical back-end-of-line integration. This miscibility gap results in phase separation of two different alloys, both with different composition and crystal structure. While the alloying of small Te concentrations does indeed result in a desired reduction of the semiconducting bandgap, the phase separation above 14% Te incorporation prohibits bandgap tuning for a wider range of applications. These results highlight the competing energies and kinetics associated with producing uniform WSe(2-x)Tex alloys.
引用
收藏
页数:8
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