Molecular beam epitaxy of high-quality ZnO using hydrogen peroxide as an oxidant

被引:42
作者
Izyumskaya, N
Avrutin, V
Schoch, W
El-Shaer, A
Reuss, F
Gruber, T
Waag, A
机构
[1] Univ Ulm, Abt Halbleiterphys, D-89069 Ulm, Germany
[2] Tech Univ Carolo Wilhelmina Braunschweig, Inst Halbleitertech, D-38106 Braunschweig, Germany
关键词
molecular beam epitaxy; zinc oxide; semiconducting II-VI materials;
D O I
10.1016/j.jcrysgro.2004.04.120
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
ZnO layers were grown on (0 0 0 1) GaN/sapphire substrates by molecular beam epitaxy (MBE) with the use of hydrogen peroxide as an oxidant. Single-crystal ZnO films were found to grow at substrate temperatures from 400degreesC to 650degreesC, whereas textured ZnO layers were prepared at the temperatures below 400degreesC. Structural and optical properties as well as surface morphology of the single-crystal ZnO films were investigated as a function of growth parameters. The single-crystal material showed strong bound-exciton (BE) emission with a full-width at half-maximum down to 4.7meV. The increase in both substrate temperature and Zn flux was found to result in higher crystal perfection and stronger BE emission. The data obtained prove the feasibility of the peroxide-assisted MBE for the growth of high-quality ZnO layers. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:356 / 361
页数:6
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