In situ X-ray investigation of lattice strain in SrTiO3/La0.7Sr0.3MnO3 thin films induced by piezoelectric 0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 substrate in an external electric field

被引：0

作者：

Levin, A. A. ^{[1
]}

Weissbach, T. ^{[1
]}

Pommrich, A. I. ^{[1
]}

Bilani-Zeneli, O. ^{[2
]}

Meyer, D. C. ^{[1
]}

机构：

[1] Tech Univ Dresden, Inst Strukturphys, D-01062 Dresden, Germany

[2] IFW Dresden, Inst Metall Mat, D-01171 Dresden, Germany

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2009年 / 96卷 / 03期

关键词：

TEMPERATURE; TRANSITION; PLATE;

D O I：

10.1007/s00339-008-5048-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Composite structures consisting of (001)-oriented SrTiO3 (STO)/La0.7Sr0.3MnO3 (LSMO) films of 30 nm thickness, grown on an (001) Pb(Mg1/3Nb2/3)TiO3- 28 mol.% PbTiO3 piezoelectric relaxor-ferroelectric single-crystalline wafer were investigated by means of Wide-Angle X-ray Diffraction (WAXRD) in situ under influence of a d.c. electric field with strength E up to +/- 18 kV/cm. The WAXRD measurements of the films and substrate reflection profiles resulted in a determination of the strain s in the films and the substrate separately. The strained state of the STO/LSMO films is effectively controlled by a huge converse piezoelectric effect of the PMN-PT substrate. The coefficients of coupling between electric-field-induced out-of-plane strain in the films and in the substrate for the composite system STO/LSMO/PMN-PT are obtained.

引用

页码：575 / 580

页数：6

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