A generalized fault diagnosis method in dynamic analogue circuits

被引:29
作者
Liu, D [1 ]
Starzyk, JA [1 ]
机构
[1] Ohio Univ, Sch Elect Engn & Comp Sci, Athens, OH 45701 USA
关键词
fault diagnosis; fault verification; linear analogue circuits; ambiguity groups;
D O I
10.1002/cta.187
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fault diagnosis of analogue circuits is essential for analogue and mixed-signal systems testing and maintenance. A new method is proposed in this paper for multiple fault diagnosis of linear analogue circuits in frequency domain. The Woodbury formula is applied to the modified nodal equation to construct the fault diagnosis equation, which relates the limited measured circuit responses with the multiple faults inside the circuit in a linear way. A recently developed ambiguity group locating technique is modified here to identify the faulty parameters directly. Computation cost is reduced compared to combinatorial search in traditional fault verification methods. Only one node is needed for voltage measurement, but multiple excitations on accessible nodes are required for fault identification. Parameter evaluation can provide the exact solution to the deviated values of faulty parameters. The faulty parameter deviations can have any finite values. Example circuits are provided to illustrate the proposed method, Two other methods for multiple analogue fault diagnosis sharing the same mechanism as the method proposed in this paper are also briefly described. The proposed method is extremely effective for the circuit with very limited accessible nodes and is also computationally efficient. Copyright (C) 2002 John Wiley Sons, Ltd.
引用
收藏
页码:487 / 510
页数:24
相关论文
共 17 条
[1]  
[Anonymous], 1991, TESTING DIAGNOSIS AN
[2]   FAULT-DIAGNOSIS OF ANALOG CIRCUITS [J].
BANDLER, JW ;
SALAMA, AE .
PROCEEDINGS OF THE IEEE, 1985, 73 (08) :1279-1325
[3]   AUTOMATIC TEST GENERATION TECHNIQUES FOR ANALOG CIRCUITS AND SYSTEMS - REVIEW [J].
DUHAMEL, P ;
RAULT, JC .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1979, 26 (07) :411-440
[4]  
HAUSEHOLDER AS, 1965, THEORY MATRICES NUME
[5]   Selection of test nodes for analog fault diagnosis in dictionary approach [J].
Prasad, VC ;
Babu, NSC .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2000, 49 (06) :1289-1297
[6]  
Robotycki A, 2000, IEEE IMTC P, P1050, DOI 10.1109/IMTC.2000.848901
[7]   LINEAR CIRCUITS AND STATISTICAL DESIGN [J].
SEMMELMAN, CL ;
WALSH, ED ;
DARYANAN.GT .
BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (04) :1149-+
[8]   Finding ambiguity groups in low testability analog circuits [J].
Starzyk, JA ;
Pang, J ;
Manetti, S ;
Piccirilli, MC .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 2000, 47 (08) :1125-1137
[9]  
STARZYK JA, 2001, P 15 EUR C CIRC THEO
[10]  
STARZYK JA, 2001, P IEEE INT S CIRC SY, V5, P199