Single ion hitting to living samples

被引:7
作者
Sakai, T [1 ]
Naitoh, Y [1 ]
Kamiya, T [1 ]
Kobayashi, Y [1 ]
机构
[1] Japan Atom Energy Res Inst, Takasaki Radiat Chem Res Estab, Takasaki, Gumma 3701292, Japan
关键词
single ion; nuclear microprobe; external beam; biological samples; fast beam deflection;
D O I
10.1016/S0168-583X(99)00529-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Single ion hit system for living biological samples has been designed. An external scanning microbeam system with about 1 mu m spatial resolution, a fast beam chopping system with less than 5 ns and a thin plastic scintillator based transmission-type detection system are combined together at the JAERI light ion microbeam system. The first step to develop a single ion facility was completed in this work. The next steps to verify the reliability of the total system have been started. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:250 / 254
页数:5
相关论文
共 9 条
[1]   Design of a single ion hit facility [J].
Cholewa, M ;
Saint, A ;
Legge, GJF ;
Kamiya, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4) :275-279
[2]   Two approaches for irradiating cells individually: a charged-particle microbeam and a soft X-ray microprobe [J].
Folkard, M ;
Vojnovic, B ;
Schettino, G ;
Forsberg, M ;
Bowey, G ;
Prise, KM ;
Michael, BD ;
Michette, AG ;
Pfauntsch, SJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4) :270-274
[3]   An automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage [J].
Kamiya, T ;
Sakai, T ;
Naitoh, Y ;
Hamano, T ;
Hirao, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 158 (1-4) :255-259
[4]   Sub-micron microbeam apparatus for high resolution materials analyses [J].
Kamiya, T ;
Suda, T ;
Tanaka, R .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 118 (1-4) :447-450
[5]   Secondary electron emission from boron-doped diamond under ion impact: Applications in single-ion detection [J].
Kamiya, T ;
Cholewa, M ;
Saint, A ;
Prawer, S ;
Legge, GJF ;
Butler, JE ;
Vestyck, DJ .
APPLIED PHYSICS LETTERS, 1997, 71 (13) :1875-1877
[6]   High energy single ion hit system combined with heavy ion microbeam apparatus [J].
Kamiya, T ;
Suda, T ;
Tanaka, R .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 118 (1-4) :423-425
[7]  
KOBAYASHI Y, 1995, JAERI TIARA ANN REPO, V5, P38
[8]   Recent progress in JAERI single ion hit system [J].
Sakai, T ;
Hamano, T ;
Suda, T ;
Hirao, T ;
Kamiya, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4) :498-502
[9]  
SAKAI T, 1998, INT C NUCL AN METH L