Computational and experimental study of a microwave electromagnetic bandgap structure with waveguiding defect for potential use as a bandpass wireless interconnect

被引:45
作者
Simpson, JJ [1 ]
Taflove, A
Mix, JA
Heck, H
机构
[1] Northwestern Univ, Technol Inst, Elect & Comp Engn Dept, Evanston, IL 60208 USA
[2] Intel Corp, Interconnect Technol, Hillsboro, OR 97124 USA
关键词
finite-difference time-domain (FDTD); metallic electromagnetic bandgap (EBG) structure; millimeter wave; waveguide; wireless interconnects;
D O I
10.1109/LMWC.2004.829283
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As clock rates continue to rise, problems with signal integrity, cross-coupling, and radiation may render impractical the baseband metallic interconnects presently used in computers. A potential means to address this problem is to use bandpass wireless interconnects operating at millimeter-wave center frequencies. We have conducted experimental and finite-difference time-domain (FDTD) computational studies scaled to a 10 GHz center frequency of single-row and double-row waveguiding defects within an electromagnetic bandgap structure. Our initial experimental results scaled to 10 GHz have verified the feasibility of achieving an approximately 80% bandwidth with excellent stopband, gain flatness, and matching characteristics. When scaled to millimeter-wave center frequencies above 300 GHz, this technology appears feasible of supporting data rates in the hundreds of Gb/s.
引用
收藏
页码:343 / 345
页数:3
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