Resonant soft X-ray scattering in polymer science

被引:38
|
作者
Collins, Brian A. [1 ]
Gann, Eliot [2 ]
机构
[1] Washington State Univ, Phys & Astron, Pullman, WA 99164 USA
[2] Natl Inst Stand & Technol, Mat Measurement Lab, Gaithersburg, MD 20899 USA
关键词
NEXAFS spectroscopy; resonant soft X-ray scattering; small angle scattering; chemical and orientational nanostructure; polymer and small molecule materials; CARBON-K-EDGE; COPOLYMER THIN-FILMS; IN-SITU REMOVAL; BLOCK-COPOLYMERS; MOLECULAR-ORIENTATION; CONJUGATED POLYMER; STRUCTURAL-CHARACTERIZATION; SYNCHROTRON-RADIATION; ANOMALOUS DIFFRACTION; INTERFACIAL WIDTHS;
D O I
10.1002/pol.20210414
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Resonant soft X-ray scattering (RSoXS) is an emerging, powerful technique to probe the nano-to-mesoscale structure of polymers and other molecules. It joins together small-angle X-ray scattering (a statistical nanoprobe) with X-ray spectroscopy that brings with it unique chemical and bond-orientation sensitivity. Through over a decade of discovery and development, RSoXS is moving from a niche technique applied to organic electronic thin films to a mature tool applicable to a plethora of polymeric and molecular systems, encompassing new modalities, analyses, and simulation methods. This development promises to deliver increasingly quantitative answers to challenging questions in polymer science as well as expand its usefulness to complementary fields. This review presents a full synopsis of the technique, including background on the theoretical underpinnings, measurement best practices, and examples of recent RSoXS applications and discoveries provided here to accelerate the transition to a broader range of soft matter and polymeric fields.
引用
收藏
页码:1199 / 1243
页数:45
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