Determination of the optical constants and thickness of holographic materials

被引：2
|
作者：
Beléndez, A [1 ]
Ortuño, M
Gallego, S
Beléndez, T
Neipp, C
Pascual, I
机构：
[1] Univ Alicante, Dept Fis Ingn Sistemas & Teoria Senal, E-03080 Alicante, Spain
[2] Univ Alicante, Dept Interuniv Opt, E-03080 Alicante, Spain
来源：
BOLETIN DE LA SOCIEDAD ESPANOLA DE CERAMICA Y VIDRIO | 2004年 / 43卷 / 02期
关键词：
holographic recording materials; capas delgadas; constantes opticas;
D O I：
10.3989/cyv.2004.v43.i2.568
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A technique to evaluate the refractive index, the absorption coefficient and the thickness of holographic recording materials is presented. The materials are in the form of a thin layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angle, and the values of refractive index, thickness and absorption coefficient of the layer are obtained using the theoretical equation for reflectance. As examples, holographic silver halide emulsions and photopolymers are analyzed. The agreement between the calculated reflectances, using the thickness and refractive index obtained, and the measured reflectances is satisfactory.
引用
收藏
页码：457 / 460
页数：4
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