Determination of the optical constants and thickness of holographic materials

被引:2
|
作者
Beléndez, A [1 ]
Ortuño, M
Gallego, S
Beléndez, T
Neipp, C
Pascual, I
机构
[1] Univ Alicante, Dept Fis Ingn Sistemas & Teoria Senal, E-03080 Alicante, Spain
[2] Univ Alicante, Dept Interuniv Opt, E-03080 Alicante, Spain
关键词
holographic recording materials; capas delgadas; constantes opticas;
D O I
10.3989/cyv.2004.v43.i2.568
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A technique to evaluate the refractive index, the absorption coefficient and the thickness of holographic recording materials is presented. The materials are in the form of a thin layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angle, and the values of refractive index, thickness and absorption coefficient of the layer are obtained using the theoretical equation for reflectance. As examples, holographic silver halide emulsions and photopolymers are analyzed. The agreement between the calculated reflectances, using the thickness and refractive index obtained, and the measured reflectances is satisfactory.
引用
收藏
页码:457 / 460
页数:4
相关论文
共 50 条
  • [1] A spectrophotometric method for determination of the optical constants of materials
    Kotlikov, E. N.
    JOURNAL OF OPTICAL TECHNOLOGY, 2016, 83 (02) : 77 - 80
  • [2] Determination of optical constants of polyquinoxalines as electroluminescent materials
    Fukuda, T
    Kanbara, T
    Yamamoto, T
    Nakao, S
    Ishikawa, K
    Takezoe, H
    Fukuda, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (2A): : 761 - 764
  • [3] Determination of optical constants of polyquinoxalines as electroluminescent materials
    Fukuda, Takashi
    Kanbara, Takaki
    Yamamoto, Takakazu
    Nakao, Satoru
    Ishikawa, Ken
    Takezoe, Hideo
    Fukuda, Atsuo
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (2 A): : 761 - 764
  • [4] A computer program for determination of thin films thickness and optical constants
    Caricato, AP
    Fazzi, A
    Leggieri, G
    APPLIED SURFACE SCIENCE, 2005, 248 (1-4) : 440 - 445
  • [5] DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON
    SWANEPOEL, R
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (12): : 1214 - 1222
  • [6] Determination of optical constants and thickness of amorphous GaP thin film
    Pimpabute, Nuwat
    Burinprakhon, Thanusit
    Somkhunthot, Weerasak
    OPTICA APPLICATA, 2011, 41 (01) : 257 - 268
  • [7] Determination and interpretation of the optical constants for solar cell materials
    Fujiwara, Hiroyuki
    Fujimoto, Shohei
    Tamakoshi, Masato
    Kato, Masato
    Kadowaki, Hideyuki
    Miyadera, Tetsuhiko
    Tampo, Hitoshi
    Chikamatsu, Masayuki
    Shibata, Hajime
    APPLIED SURFACE SCIENCE, 2017, 421 : 276 - 282
  • [8] SIMPLE METHOD FOR DETERMINATION OF OPTICAL CONSTANTS OF ABSORBING MATERIALS
    SCHMIDT, E
    APPLIED OPTICS, 1969, 8 (09): : 1905 - &
  • [9] NONAMBIGUOUS DETERMINATION OF OPTICAL-CONSTANTS FOR ABSORBING MATERIALS
    GORI, F
    GUATTARI, G
    APPLIED OPTICS, 1991, 30 (01): : 36 - 41
  • [10] Double-thickness inversion methods of optical constants of window materials
    Li, Dong
    Zheng, Yu-Meng
    Xia, Xin-Lin
    Ai, Qing
    Kung Cheng Je Wu Li Hsueh Pao/Journal of Engineering Thermophysics, 2015, 36 (01): : 125 - 129