Film calibration for soft X-ray wavelengths

The response of photographic film to X-rays from laser-plasmas is of practical interest. Film is often used for the ultimate detection of X-rays in crystal and grating spectrometers and in imaging instruments such as pinhole cameras largely because of its high spatial resolution (approximately 1-10 microns). Characteristic curves for wavelengths similar to 3 nm and 23 nm are presented for eight X-ray films (Kodak 101-01, 101-07, 104-02, Kodak Industrex CX, Russian UF-SH4, UF-VR2, Ilford Q plates and Shanghai 5F film). The calibrations were obtained from the emission of laser-produced carbon plasmas and a Ne-like Ge X-ray laser.