The lifetime of green phosphorescent organic light-emitting diodes was correlated with the charge leakage and recombination zone of the devices. The lifetime of green devices was decreased in the device with an electron leakage out of an emitting layer into a hole transport layer. In particular, the decrease in lifetime at high luminance was significant in the device with an electron leakage into the hole transport layer. In addition, the recombination zone of green devices was shifted from the hole transport layer side to the electron transport layer side during driving.
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Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USAUniv Michigan, Dept Phys, Ann Arbor, MI 48109 USA
Zhang, Yifan
Lee, Jaesang
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Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USAUniv Michigan, Dept Phys, Ann Arbor, MI 48109 USA
Lee, Jaesang
Forrest, Stephen R.
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Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USAUniv Michigan, Dept Phys, Ann Arbor, MI 48109 USA