Correlation of lifetime and recombination zone in green phosphorescent organic light-emitting diodes

被引:15
|
作者
Yook, Kyoung Soo [1 ]
Jeon, Soon Ok [1 ]
Joo, Chul Woong [1 ]
Lee, Jun Yeob [1 ]
机构
[1] Dankook Univ, Dept Polymer Sci & Engn, Yongin 448701, Gyeonggi, South Korea
关键词
brightness; carrier lifetime; electron-hole recombination; organic light emitting diodes; phosphorescence; STABILITY; DEVICES;
D O I
10.1063/1.3083547
中图分类号
O59 [应用物理学];
学科分类号
摘要
The lifetime of green phosphorescent organic light-emitting diodes was correlated with the charge leakage and recombination zone of the devices. The lifetime of green devices was decreased in the device with an electron leakage out of an emitting layer into a hole transport layer. In particular, the decrease in lifetime at high luminance was significant in the device with an electron leakage into the hole transport layer. In addition, the recombination zone of green devices was shifted from the hole transport layer side to the electron transport layer side during driving.
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页数:3
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