Manipulation of C60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy

被引:16
作者
Loske, Felix [1 ]
Kuehnle, Angelika [1 ]
机构
[1] Univ Osnabruck, Fachbereich Phys, D-49076 Osnabruck, Germany
关键词
atomic force microscopy; domain boundaries; fullerenes; SCANNING TUNNELING MICROSCOPE; LATERAL MANIPULATION; SINGLE ATOMS; MOLECULE; TIP;
D O I
10.1063/1.3184784
中图分类号
O59 [应用物理学];
学科分类号
摘要
Regular, almost quadratic pits were created in an island of C-60 molecules on a rutile TiO2 (110) surface using noncontact atomic force microscopy at room temperature. Upon gradually approaching the scanning tip toward the surface, the interaction between the tip and the C-60 island was increased until manipulation was achieved. Analyzing the manipulation process unambiguously revealed that the manipulation was performed in the repulsive regime. Retracting the tip allowed for reproducible imaging the C-60 island after the manipulation process. Moreover, whole islands could be reshaped or even removed when scanning with appropriate scanning parameters.
引用
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页数:3
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