Influence of laser irradiation condition on a femtosecond laser-assisted tomographic atom probe

被引：5

作者：

Nishimura, A. ^{[1
,3
]}

Nogiwa, K. ^{[1
,3
]}

Otobe, T. ^{[1
,3
]}

Ohkubo, T. ^{[2
,3
]}

Hono, K. ^{[2
,3
]}

Kondo, K. ^{[1
,3
]}

Yokoyama, A. ^{[1
,3
]}

机构：

[1] Japan Atom Energy Agcy, Kyoto 6190215, Japan

[2] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan

[3] CREST JST, Tokyo, Japan

来源：

ULTRAMICROSCOPY | 2009年 / 109卷 / 05期

关键词：

Tomographic atom probe; Laser-assisted field evaporation; Femtosecond laser; Numerical simulation; Optical dielectric breakdown; FIELD-ION MICROSCOPY; ABLATION; METAL;

D O I：

10.1016/j.ultramic.2008.11.027

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Influence of femtosecond laser pulse condition on the performance of an energy-compensated optical tomographic atom probe has been investigated. The unstable oscillator makes the mass peaks significantly broadened. Double 80 fs pulse train with 10 ns interval makes the mass peaks slightly shifted to the higher mass side. The mass peak shift corresponds to the fight time of ions triggered by laser pulsing. Chirping ratio for the laser pulses ranging from 80 fs to 10 ps is controlled by the pulse compressor for the fragile specimens such as oxide dispersion strengthen steel or insulator materials. A first-principle calculation for optical dielectric breakdown in diamond has been successfully demonstrated. It is shown that effective conductive increase has appeared at the laser intensity around 10(13)W/cm(2). (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：467 / 471

页数：5

共 18 条

[1] Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
Cerezo, A
Smith, GDW
Clifton, PH
[J]. APPLIED PHYSICS LETTERS, 2006, 88 (15)
[2] Chichkov BN, 1996, APPL PHYS A-MATER, V63, P109, DOI 10.1007/BF01567637
[3] Design of a femtosecond laser assisted tomographic atom probe
Gault, B
Vurpillot, F
Vella, A
Gilbert, M
Menand, A
Blavette, D
Deconihout, B
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (04)
[4] Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopy
Hono, K
[J]. PROGRESS IN MATERIALS SCIENCE, 2002, 47 (06) : 621 - 729
[5] Thermal stability of Co/SiO2 multilayers for use in the soft x-ray region
Ishino, Masahiko
Koike, Masato
Kanehira, Mika
Satou, Futami
Terauchi, Masami
Sano, Kazuo
[J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (02)
[6] Chemical vapor deposition diamond window for high-power and long pulse millimeter wave transmission
Kasugai, A
Sakamoto, K
Takahashi, K
Tsuneoka, M
Kariya, T
Imai, T
Braz, O
Thumm, M
Brandon, JR
Sussman, RS
Beale, A
Ballington, DC
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (05) : 2160 - 2165
[7] PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPY
KELLOGG, GL
TSONG, TT
[J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 1184 - 1193
[8] Miller M.K., 1996, ATOM PROBE FIELD ION
[9] NISHIMURA A, 2004, SPIE, V5662, P673
[10] Ablation of metals by ultrashort laser pulses
Nolte, S
Momma, C
Jacobs, H
Tunnermann, A
Chichkov, BN
Wellegehausen, B
Welling, H
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1997, 14 (10) : 2716 - 2722

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