A Compact Electromagnetic Bandgap Structure based on Multi-layer Technology for 7-Tesla Magnetic Resonance Imaging Applications

被引：0

作者：

Chen, Zhichao ^{[1
,2
,3
]}

Solbach, Klaus ^{[3
]}

Erni, Daniel ^{[1
,2
]}

Rennings, Andreas ^{[1
,2
]}

机构：

[1] Univ Duisburg Essen, Fac Engn, ATE, Gen & Theoret Elect Engn, D-47048 Duisburg, Germany

[2] CENIDE Ctr Nanointegrat Duisburg Essen, D-47048 Duisburg, Germany

[3] Univ Duisburg Essen, Fac Engn, HFT, D-47048 Duisburg, Germany

来源：

2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2014年

关键词：

Electromagnetic bandgap (EBG) structure; multi-layer; size miniaturization; 7-Tesla MRI applications;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A compact electromagnetic bandgap (EBG) structure based on multi-layer technology for 7-Tesla magnetic resonance imaging (MRI) applications is presented. The proposed structure introduces an additional floating metallic layer between the top surface and the ground plane of the conventional single-layer uni-planar EBG structures, which provides more capacitive coupling between the adjacent unit cells. Thus, for the desired operating frequency (300 MHz), a miniaturized dimension of the unit cell, about 2.6% of the free-space wavelength, is achieved. The proposed structure is characterized by the reflection phase and the stop-band properties. The full-wave simulations and experimental results show a good agreement.

引用

页码：1576 / 1579

页数：4

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