Origin and compensation of imaging artefacts in localization-based super-resolution microscopy

被引：9

作者：

Erdelyi, M. ^{[1
]}

Sinko, J. ^{[1
]}

Kakonyi, R. ^{[1
]}

Kelemen, A. ^{[2
]}

Rees, E. ^{[3
]}

Varga, D. ^{[1
]}

Szabo, G. ^{[1
]}

机构：

[1] Univ Szeged, Dept Opt & Quantum Elect, H-6720 Szeged, Hungary

[2] Univ Szeged, Dept Appl Informat, H-6725 Szeged, Hungary

[3] Univ Cambridge, Dept Chem Engn & Biotechnol, Cambridge CB2 3RA, England

来源：

METHODS | 2015年 / 88卷

基金：

英国工程与自然科学研究理事会;

关键词：

Super-resolution microscopy; Localization microscopy; Imaging artefacts; Localization error; OPTICAL RECONSTRUCTION MICROSCOPY; SINGLE-MOLECULE LOCALIZATION; RESOLUTION LIMIT; SUBDIFFRACTION-RESOLUTION; ALGORITHMS; ACCURACY; BREAKING; FLUOROPHORES; PERFORMANCE; NANOSCOPY;

D O I：

10.1016/j.ymeth.2015.05.025

中图分类号：

Q5 [生物化学];

学科分类号：

071010 ; 081704 ;

摘要：

Interpretation of high resolution images provided by localization-based microscopy techniques is a challenge due to imaging artefacts that can be categorized by their origin. They can be introduced by the optical system, by the studied sample or by the applied algorithms. Some artefacts can be eliminated via precise calibration procedures, others can be reduced only below a certain value. Images studied both theoretically and experimentally are qualified either by pattern specific metrics or by a more general metric based on fluorescence correlation spectroscopy. (C) 2015 Elsevier Inc. All rights reserved.

引用

页码：122 / 132

页数：11

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