Electronic structure of GaN studied with electron energy loss spectroscopy and density functional theory

被引:0
|
作者
Keast, VJ
Scott, AJ
Kappers, MJ
Humphreys, CJ
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[2] Univ Leeds, Dept Mat, Leeds LS2 9JT, W Yorkshire, England
来源
ELECTRON MICROSCOPY AND ANALYSIS 2001 | 2001年 / 168期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The Electron Energy Loss Near-Edge Structure (ELNES) is related to a site- and symmetry-projected, unoccupied density of states (DOS). Therefore, it contains information about the electronic structure and interatomic bonding of materials. In this work,GaN, an important light-emitting semiconductor, is studied. Experimental spectra are compared to theoretical spectra, based on a calculation of the DOS, and excellent agreement is observed when the effects of the core-hole are included. The anisotropy of the electronic structure is also investigated and a discussion of the nature of the bonding in GaN is given.
引用
收藏
页码:441 / 444
页数:4
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