Thermocouples with Built-In Self-testing

被引：23

作者：

Jun, Su ^{[1
]}

Kochan, Orest ^{[2
]}

Kochan, Roman ^{[2
]}

机构：

[1] Hubei Univ Technol, Sch Comp Sci, Wuhan, Peoples R China

[2] Lviv Natl Polytech Univ, Bandera Str 12, UA-79013 Lvov, Ukraine

来源：

INTERNATIONAL JOURNAL OF THERMOPHYSICS | 2016年 / 37卷 / 04期

基金：

中国国家自然科学基金;

关键词：

Built-in self-testing; Self-testing; Thermocouple; Thermocouple inhomogeneity; Thermocouple drift model; INHOMOGENEITY;

D O I：

10.1007/s10765-016-2044-2

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

The aim of this paper is to create a method of built-in self-testing of thermocouples in situ. This aim is achieved by using the equivalent operating time of the thermocouple. The method does not require replacement of thermocouples from their operating place as it could be done during the operation of the thermocouples. The only necessary condition, that makes self-testing possible, is a constant measuring junction temperature during the procedure of self-testing. The determined equivalent operating time allows finding the place of a given thermocouple in the thermocouple's drift model as well as in the model of thermoelectric inhomogeneity.

引用

页码：1 / 9

页数：9

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[1] Thermocouples with Built-In Self-testing [J].

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[3] A concurrent built-in self-test architecture based on a self-testing RAM [J].

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[4] A New Approach to the Design of Built-in Internal Memory Self-Testing Devices [J].

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[10] Self-testing: A new testing approach [J].

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