Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments

被引：8

作者：

Prather, DW ^{[1
]}

Shi, S ^{[1
]}

机构：

[1] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19716 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2000年 / 17卷 / 04期

关键词：

D O I：

10.1364/JOSAA.17.000729

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present the electromagnetic analysis of axially symmetric diffractive lenses. Analysis is performed by numerically solving the electric and magnetic field integral equations using the method of moments, and it exploits axial symmetry to reduce computational cost. Formulations for the analysis of lossless dielectric and perfectly conducting lenses are presented. The analysis of binary and eight-level lenses are performed to illustrate the utility of the technique. (C) 2000 Optical Society of America [S0740-3 232(00)01104-2] OCIS code: 050.1970.

引用

页码：729 / 739

页数：11

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