Single photon counting X-ray imaging with Si and CdTe single chip pixel detectors and multichip pixel modules

被引:63
作者
Löcker, M
Fischer, P
Krimmel, S
Krüger, H
Lindner, M
Nakazawa, K
Takahashi, T
Wermes, N
机构
[1] Univ Bonn, D-53115 Bonn, Germany
[2] Univ Mannheim, Inst Tech Informat, Mannheim, Germany
[3] Inst Space & Astronaut Sci, JAXA, Kanagawa 2298510, Japan
[4] Univ Tokyo, Dept Phys, Bunkyo Ku, Tokyo 1130033, Japan
关键词
CdTe; multichip module; photon counting; pixel detector; Si; X-ray imaging;
D O I
10.1109/TNS.2004.832610
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multichip modules (MCM) have been successfully built and operated. These use 4 single-photon counting MPEC 2.3 chips that are bump bonded to 1.3 cm x 1.3 cm CdTe or Si semiconductor pixel sensors. Single-chip detectors were built as well. The MPEC 2.3 chip provides a pixel count rate up to 1 MHz with a large dynamic range of 18 bits, 2 counters and energy windowing with continuously adjustable thresholds. Each MPEC has 32 x 32 pixels of 200 mum x 200 mum pixel size. For a MCM the 4 chips are arranged in a 2 x 2 array which leads to a 64 x 64 sensor pixel geometry. The MCM construction is described, and the imaging performance of the different detectors is shown. A newly developed USB readout system has been used.
引用
收藏
页码:1717 / 1723
页数:7
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