Multiple-scale analysis of plane wave refraction at a dielectric slab with Kerr-type nonlinearity

被引:6
|
作者
Zamani Aghaie, K. [1 ]
Shahabadi, M. [1 ]
机构
[1] Univ Tehran, Dept Elect & Comp Engn, Tehran, Iran
关键词
D O I
10.2528/PIER05051701
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multiple-scale analysis is employed for the analysis of plane wave refraction at a nonlinear slab. It will be demonstrated that the perturbation method will lead to a nonuniformly valid approximation to the solution of the nonlinear wave equation. To construct a uniformly valid approximation, we will exploit multiple-scale analysis. Using this method, we will derive the zerothorder approximation to the solution of the nonlinear wave equation analytically. This approximate solution clearly shows the effects of self-phase modulation (SPM) and cross-phase modulation (XPM) on plane wave refraction at the nonlinear slab. In fact, the obtained zeroth-order approximation is very accurate and there is not any need for derivation of higher-order approximations. As will be shown, the proposed method can be generalized to the rigorous study of nonlinear wave propagation in one-dimensional photonic band-gap structures.
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页码:81 / 92
页数:12
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