共 91 条
Thermal scanning probe lithography
被引:34
作者:

Albisetti, Edoardo
论文数: 0 引用数: 0
h-index: 0
机构:
Polytech Univ Milan, Dept Phys, Milan, Italy Polytech Univ Milan, Dept Phys, Milan, Italy

Calo, Annalisa
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Barcelona, Dept Elect & Biomed Engn, Barcelona, Spain
Inst Bioengn Catalonia IBEC, Nanoscale Bioelect Characterizat Grp, Barcelona, Spain Polytech Univ Milan, Dept Phys, Milan, Italy

Zanut, Alessandra
论文数: 0 引用数: 0
h-index: 0
机构:
NYU, Tandon Sch Engn, New York, NY 10003 USA Polytech Univ Milan, Dept Phys, Milan, Italy

Zheng, Xiaorui
论文数: 0 引用数: 0
h-index: 0
机构:
Westlake Univ, Sch Engn, Hangzhou, Zhejiang, Peoples R China Polytech Univ Milan, Dept Phys, Milan, Italy

de Peppo, Giuseppe Maria
论文数: 0 引用数: 0
h-index: 0
机构:
NYU, Tandon Sch Engn, New York, NY 10003 USA Polytech Univ Milan, Dept Phys, Milan, Italy

Riedo, Elisa
论文数: 0 引用数: 0
h-index: 0
机构:
NYU, Tandon Sch Engn, New York, NY 10003 USA Polytech Univ Milan, Dept Phys, Milan, Italy
机构:
[1] Polytech Univ Milan, Dept Phys, Milan, Italy
[2] Univ Barcelona, Dept Elect & Biomed Engn, Barcelona, Spain
[3] Inst Bioengn Catalonia IBEC, Nanoscale Bioelect Characterizat Grp, Barcelona, Spain
[4] NYU, Tandon Sch Engn, New York, NY 10003 USA
[5] Westlake Univ, Sch Engn, Hangzhou, Zhejiang, Peoples R China
来源:
NATURE REVIEWS METHODS PRIMERS
|
2022年
/
2卷
/
01期
基金:
美国国家科学基金会;
欧洲研究理事会;
关键词:
FORCE MICROSCOPE CANTILEVERS;
THERMOCHEMICAL NANOLITHOGRAPHY;
BEAM LITHOGRAPHY;
FEATURE SIZE;
SILICON;
POLYMER;
TIP;
DESIGN;
SPEED;
MOS2;
D O I:
10.1038/s43586-022-00110-0
中图分类号:
O [数理科学和化学];
P [天文学、地球科学];
Q [生物科学];
N [自然科学总论];
学科分类号:
07 ;
0710 ;
09 ;
摘要:
Thermal scanning probe lithography (tSPL) is a nanofabrication method for the chemical and physical nanopatterning of a large variety of materials and polymer resists with a lateral resolution of 10 nm and a depth resolution of 1 nm. In this Primer, we describe the working principles of tSPL and highlight the characteristics that make it a powerful tool to locally and directly modify material properties in ambient conditions. We introduce the main features of tSPL, which can pattern surfaces by locally delivering heat using nanosized thermal probes. We define the most critical patterning parameters in tSPL and describe post-patterning analysis of the obtained results. The main sources of reproducibility issues related to the probe and the sample as well as the limitations of the tSPL technique are discussed together with mitigation strategies. The applications of tSPL covered in this Primer include those in biomedicine, nanomagnetism and nanoelectronics; specifically, we cover the fabrication of chemical gradients, tissue-mimetic surfaces, spin wave devices and field-effect transistors based on two-dimensional materials. Finally, we provide an outlook on new strategies that can improve tSPL for future research and the fabrication of next-generation devices.
引用
收藏
页数:21
相关论文
共 91 条
[11]
Toward 4D Nanoprinting with Tip-Induced Organic Surface Reactions
[J].
Carbonell, Carlos
;
Braunschweig, Adam B.
.
ACCOUNTS OF CHEMICAL RESEARCH,
2017, 50 (02)
:190-198

Carbonell, Carlos
论文数: 0 引用数: 0
h-index: 0
机构:
CUNY, Adv Sci Res Ctr, 85 St Nicholas Terrace, New York, NY 10031 USA CUNY, Adv Sci Res Ctr, 85 St Nicholas Terrace, New York, NY 10031 USA

Braunschweig, Adam B.
论文数: 0 引用数: 0
h-index: 0
机构:
CUNY, Adv Sci Res Ctr, 85 St Nicholas Terrace, New York, NY 10031 USA
CUNY Hunter Coll, Dept Chem & Biochem, 695 Pk Ave, New York, NY 10065 USA CUNY, Adv Sci Res Ctr, 85 St Nicholas Terrace, New York, NY 10031 USA
[12]
Speed Dependence of Thermochemical Nanolithography for Gray-Scale Patterning
[J].
Carroll, Keith M.
;
Desai, Maitri
;
Giordano, Anthony J.
;
Scrimgeour, Jan
;
King, William P.
;
Riedo, Elisa
;
Curtis, Jennifer E.
.
CHEMPHYSCHEM,
2014, 15 (12)
:2530-2535

Carroll, Keith M.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Desai, Maitri
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA
Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Giordano, Anthony J.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

论文数: 引用数:
h-index:
机构:

King, William P.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois, Dept Mech Sci & Engn, Urbana, IL 61801 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Riedo, Elisa
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Curtis, Jennifer E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
[13]
Parallelization of thermochemical nanolithography
[J].
Carroll, Keith M.
;
Lu, Xi
;
Kim, Suenne
;
Gao, Yang
;
Kim, Hoe-Joon
;
Somnath, Suhas
;
Polloni, Laura
;
Sordan, Roman
;
King, William P.
;
Curtis, Jennifer E.
;
Riedo, Elisa
.
NANOSCALE,
2014, 6 (03)
:1299-1304

Carroll, Keith M.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Lu, Xi
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Kim, Suenne
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Hanyang Univ, Dept Appl Phys, Ansan 426791, South Korea Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Gao, Yang
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Kim, Hoe-Joon
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois Urbana Champagne, Dept Mech Sci & Engn, Urbana, IL 61801 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Somnath, Suhas
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois Urbana Champagne, Dept Mech Sci & Engn, Urbana, IL 61801 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Polloni, Laura
论文数: 0 引用数: 0
h-index: 0
机构:
Politecn Milan, Dept Phys, L NESS, I-22100 Como, Italy
Univ Insubria, Dept Sci & High Technol, I-22100 Como, Italy Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Sordan, Roman
论文数: 0 引用数: 0
h-index: 0
机构:
Politecn Milan, Dept Phys, L NESS, I-22100 Como, Italy Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

King, William P.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois Urbana Champagne, Dept Mech Sci & Engn, Urbana, IL 61801 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Curtis, Jennifer E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Riedo, Elisa
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
[14]
Fabricating Nanoscale Chemical Gradients with ThermoChemical NanoLithography
[J].
Carroll, Keith M.
;
Giordano, Anthony J.
;
Wang, Debin
;
Kodali, Vamsi K.
;
Scrimgeour, Jan
;
King, William P.
;
Marder, Seth R.
;
Riedo, Elisa
;
Curtis, Jennifer E.
.
LANGMUIR,
2013, 29 (27)
:8675-8682

Carroll, Keith M.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Giordano, Anthony J.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Wang, Debin
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Kodali, Vamsi K.
论文数: 0 引用数: 0
h-index: 0
机构:
Pacific NW Natl Lab, Richland, WA 99352 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Scrimgeour, Jan
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

King, William P.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Illinois Urbana Champagne, Dept Mech Sci & Engn, Urbana, IL 61801 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Marder, Seth R.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Riedo, Elisa
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA

Curtis, Jennifer E.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
Georgia Inst Technol, Parker H Petit Inst Bioengn & Biosci, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
[15]
Ultra compact electrochemical metallization cells offering reproducible atomic scale memristive switching
[J].
Cheng, Bojun
;
Emboras, Alexandros
;
Salamin, Yannick
;
Ducry, Fabian
;
Ma, Ping
;
Fedoryshyn, Yuriy
;
Andermatt, Samuel
;
Luisier, Mathieu
;
Leuthold, Juerg
.
COMMUNICATIONS PHYSICS,
2019, 2 (1)

Cheng, Bojun
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Emboras, Alexandros
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland
Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Salamin, Yannick
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Ducry, Fabian
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Ma, Ping
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Fedoryshyn, Yuriy
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Andermatt, Samuel
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Luisier, Mathieu
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland

Leuthold, Juerg
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland Swiss Fed Inst Technol, IEF, CH-8092 Zurich, Switzerland
[16]
Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography
[J].
Cho, Yu Kyoung Ryu
;
Rawlings, Colin D.
;
Wolf, Heiko
;
Spieser, Martin
;
Bisig, Samuel
;
Reidt, Steffen
;
Sousa, Marilyne
;
Khanal, Subarna R.
;
Jacobs, Tevis D. B.
;
Knoll, Armin W.
.
ACS NANO,
2017, 11 (12)
:11890-11897

Cho, Yu Kyoung Ryu
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Rawlings, Colin D.
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland
SwissLitho AG, Technopk Str 1, CH-8005 Zurich, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Wolf, Heiko
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Spieser, Martin
论文数: 0 引用数: 0
h-index: 0
机构:
SwissLitho AG, Technopk Str 1, CH-8005 Zurich, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Bisig, Samuel
论文数: 0 引用数: 0
h-index: 0
机构:
SwissLitho AG, Technopk Str 1, CH-8005 Zurich, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Reidt, Steffen
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Sousa, Marilyne
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Khanal, Subarna R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Pittsburgh, Pittsburgh, PA 15261 USA IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Jacobs, Tevis D. B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Pittsburgh, Pittsburgh, PA 15261 USA IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland

Knoll, Armin W.
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland
[17]
Low-stiffness silicon cantilevers with integrated heaters and piezoresistive sensors for high-density AFM thermomechanical data storage
[J].
Chui, BW
;
Stowe, TD
;
Ju, YS
;
Goodson, KE
;
Kenny, TW
;
Mamin, HJ
;
Terris, BD
;
Ried, RP
;
Rugar, D
.
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS,
1998, 7 (01)
:69-78

Chui, BW
论文数: 0 引用数: 0
h-index: 0
机构:
Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Stowe, TD
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Ju, YS
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Goodson, KE
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Kenny, TW
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Mamin, HJ
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Terris, BD
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Ried, RP
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

Rugar, D
论文数: 0 引用数: 0
h-index: 0
机构: Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[18]
Probe-Based Nanolithography: Self-Amplified Depolymerization Media for Dry Lithography
[J].
Coulembier, Olivier
;
Knoll, Armin
;
Pires, David
;
Gotsmann, Bernd
;
Duerig, Urs
;
Frommer, Jane
;
Miller, Robert D.
;
Dubois, Philippe
;
Hedrick, James L.
.
MACROMOLECULES,
2010, 43 (01)
:572-574

论文数: 引用数:
h-index:
机构:

Knoll, Armin
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Pires, David
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Gotsmann, Bernd
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Duerig, Urs
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Frommer, Jane
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Miller, Robert D.
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Dubois, Philippe
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Mons, CIRMAP, Lab Polymer & Composite Mat, B-7000 Mons, Belgium IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Hedrick, James L.
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[19]
Review of magnetic nanostructures grown by focused electron beam induced deposition (FEBID)
[J].
De Teresa, J. M.
;
Fernandez-Pacheco, A.
;
Cordoba, R.
;
Serrano-Ramon, L.
;
Sangiao, S.
;
Ibarra, M. R.
.
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
2016, 49 (24)

De Teresa, J. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain
Univ Zaragoza, LMA, INA, Zaragoza 50018, Spain
Univ Zaragoza, Fac Ciencias, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain

Fernandez-Pacheco, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Cavendish Lab, JJ Thomson Ave, Cambridge CB3 0HE, England Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain

Cordoba, R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain
Univ Zaragoza, LMA, INA, Zaragoza 50018, Spain
Univ Zaragoza, Fac Ciencias, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain

论文数: 引用数:
h-index:
机构:

Sangiao, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Zaragoza, LMA, INA, Zaragoza 50018, Spain
Univ Zaragoza, Fac Ciencias, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain

Ibarra, M. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Zaragoza, LMA, INA, Zaragoza 50018, Spain
Univ Zaragoza, Fac Ciencias, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain Univ Zaragoza, ICMA, CSIC, E-50009 Zaragoza, Spain
[20]
Synthetic antiferromagnetic spintronics
[J].
Duine, R. A.
;
Lee, Kyung-Jin
;
Parkin, Stuart S. P.
;
Stiles, M. D.
.
NATURE PHYSICS,
2018, 14 (03)
:217-219

Duine, R. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Utrecht, Inst Theoret Phys, Utrecht, Netherlands
Eindhoven Univ Technol, Dept Appl Phys, Eindhoven, Netherlands Univ Utrecht, Inst Theoret Phys, Utrecht, Netherlands

Lee, Kyung-Jin
论文数: 0 引用数: 0
h-index: 0
机构:
Korea Univ, Dept Mat Sci & Engn, Seoul, South Korea
Korea Univ, KU KIST Grad Sch Converging Sci & Technol, Seoul, South Korea Univ Utrecht, Inst Theoret Phys, Utrecht, Netherlands

Parkin, Stuart S. P.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Microstruct Phys, Halle, Saale, Germany
IBM Res Almaden, San Jose, CA USA
Martin Luther Univ Halle Wittenberg, Inst Phys, Halle, Saale, Germany Univ Utrecht, Inst Theoret Phys, Utrecht, Netherlands

Stiles, M. D.
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Stand & Technol, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA Univ Utrecht, Inst Theoret Phys, Utrecht, Netherlands