Strong invariance principles for sequential Bahadur-Kiefer and Vervaat error processes of long-range dependent sequences

被引:11
|
作者
Csorgo, Miklos
Szyszkowicz, Barbara
Wang, Lihong
机构
[1] Carleton Univ, Sch Math & Stat, Ottawa, ON K1S 5B6, Canada
[2] Nanjing Univ, Dept Math, Nanjing 210093, Peoples R China
来源
ANNALS OF STATISTICS | 2006年 / 34卷 / 02期
关键词
long-range dependence; sequential empirical and quantile processes; sequential Bahadur-Kiefer process; sequential Vervaat and Vervaat error processes; strong invariance principles;
D O I
10.1214/009053606000000164
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
In this paper we study strong approximations (invariance principles) of the sequential uniform and general Bahadur-Kiefer processes of long-range dependent sequences. We also investigate the strong and weak asymptotic behavior of the sequential Vervaat process, that is, the integrated sequential Bahadur-Kiefer process, properly normalized, as well as that of its deviation from its limiting process, the so-called Vervaat error process. It is well known that the Bahadur-Kiefer and the Vervaat error processes cannot converge weakly in the i.i.d. case. In contrast to this, we conclude that the Bahadur-Kiefer and Vervaat error processes, as well as their sequential versions, do converge weakly to a Dehling-Taqqu type limit process for certain long-range dependent sequences.
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页码:1013 / 1044
页数:32
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