Thermography and electroluminescence imaging of scribing failures in Cu(In,Ga)Se2 thin film solar modules

被引：6
|
作者：
Misic, B. [1 ]
Pieters, B. E. [1 ]
Schweitzer, U. [2 ]
Gerber, A. [1 ]
Rau, U. [1 ]
机构：
[1] Forschungszentrum Julich GmbH, IEK5 Photovoltaik, D-52425 Julich, Germany
[2] Manz AG, D-72768 Reutlingen, Germany
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2015年 / 212卷 / 12期
关键词：
Cu(In; Ga)Se-2; electroluminescence; lock-in thermography; scribing; solar modules; thin film; LUMINESCENCE; SHUNTS;
D O I：
10.1002/pssa.201532322
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Intentionally implemented scribing failures in Cu(In,Ga)Se-2 modules are studied using electroluminescence (EL) and dark lock-in thermography (DLIT). While the EL images do not allow a non-ambiguous defect distinction, the DLIT images reveal characteristic defect patterns for each defect type. In order to explain the DLIT defect appearance, we model and simulate the scribing defects in a network simulation model. The simulations yield characteristic current flow patterns for each scribing defect type and thus aid in the understanding and interpretation of the measurements. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：2877 / 2888
页数：12
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