Refractive index retrieval in the UV range using white light spectral interferometry

被引：5

作者：

Arosa, Yago ^{[1
]}

Lopez-Lago, Elena ^{[1
]}

de la Fuente, Raul ^{[1
]}

机构：

[1] Univ Santiago de Compostela, Dept Fis Aplicada & Fis Particulas, Grp Nanomat Foton & Mat Branda, E-15782 Santiago De Compostela, Spain

来源：

OPTICAL MATERIALS | 2018年 / 82卷

关键词：

UV; Refractive index; Dispersion; Spectral interferometry; White light; DISPERSION; TEMPERATURE; ULTRAVIOLET; WATER; WAVELENGTH; LIQUIDS; REGION;

D O I：

10.1016/j.optmat.2018.05.044

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Continuous refractive index measurement in the UV spectral region and a small part of the Vis region (up to 520 nm) is performed by using white light spectral interferometry. The main limitations of operating in this region are the high dispersion and high absorption. The problems derived from high dispersion are overcome taking the data in several shots, that is, recording several interferograms that must be partially overlapped. Whereas, high absorbers require the use of thinner samples, while still keeping a precise measurement of the sample width. We show the capacity of the technique with well characterized reference materials such as BK7, quartz and deionised water.

引用

页码：88 / 92

页数：5

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