Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

被引：5

作者：

Finlayson, Chris E. ^{[1
]}

Rosetta, Giselle ^{[1
]}

Tomes, John J. ^{[1
]}

机构：

[1] Prifysgol Aberystwyth Univ, Dept Phys, Aberystwyth SY23 3BZ, Dyfed, Wales

来源：

APPLIED SCIENCES-BASEL | 2022年 / 12卷 / 10期

关键词：

ellipsometry; structural color; opal; polymers; optical modelling; POLYMER; CONSTANTS; SILICON; LIGHT;

D O I：

10.3390/app12104888

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the increment and psi ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such "polymer opals" in large scale processing and applications.

引用

页数：9

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