Design of an X-ray phase-plate analyzer to measure the circular polarization rate of a helical undulator source

被引：20

作者：

Goulon, J

Malgrange, C

Giles, C

Neumann, C

Rogalev, A

Moguiline, E

DeBergevin, F

Vettier, C

机构：

[1] UNIV PARIS 06,LAB MINERAL CRISTALLOG,CNRS,F-75252 PARIS 05,FRANCE

[2] UNIV PARIS 07,LAB MINERAL CRISTALLOG,CNRS,F-75252 PARIS 05,FRANCE

[3] CRISTALLOG LAB,F-38043 GRENOBLE,FRANCE

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1996年 / 3卷

关键词：

transmission X-ray phase plates; X-ray polarimeters; helical undulator; alignment procedures;

D O I：

10.1107/S0909049596007212

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A quarter-wave plate made of a ca 16 mu m-thick silicon single crystal was used at energies as low as 2.8 keV to convert circularly polarized photons into linearly polarized photons. Coupled to a linear polarimeter, this quarter-wave plate enabled the characterization of the circular polarization rate of the radiation emitted by one of the ESRF helical undulators, Helios-I. The measured value (ca 97%) is in good agreement with theoretical predictions. Special attention was paid to the alignment procedures of all relevant optical components of the beamline.

引用

收藏

页码：272 / 281

页数：10

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