Polymer nanomechanics: Separating the size effect from the substrate effect in nanoindentation
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作者:
Li, Le
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Boston Univ, Dept Mech Engn, Boston, MA 02215 USABoston Univ, Dept Mech Engn, Boston, MA 02215 USA
Li, Le
[1
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Encarnacao, Lucas M.
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Boston Univ, Dept Mech Engn, Boston, MA 02215 USABoston Univ, Dept Mech Engn, Boston, MA 02215 USA
Encarnacao, Lucas M.
[1
]
Brown, Keith A.
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Boston Univ, Dept Mech Engn, Boston, MA 02215 USA
Boston Univ, Div Mat Sci & Engn, Boston, MA 02215 USA
Boston Univ, Dept Phys, 590 Commonwealth Ave, Boston, MA 02215 USABoston Univ, Dept Mech Engn, Boston, MA 02215 USA
Brown, Keith A.
[1
,2
,3
]
机构:
[1] Boston Univ, Dept Mech Engn, Boston, MA 02215 USA
[2] Boston Univ, Div Mat Sci & Engn, Boston, MA 02215 USA
[3] Boston Univ, Dept Phys, 590 Commonwealth Ave, Boston, MA 02215 USA
While the moduli of thin polymer films are known to deviate dramatically from their bulk values, there is not a consensus regarding the nature of this size effect. In particular, indenting experiments appear to contradict results from both buckling experiments and molecular dynamics calculations. In this letter, we present a combined computational and experimental method for measuring the modulus of nanoindented soft films on rigid substrates that reconciles this discrepancy. Through extensive finite element simulation, we determine a correction to the Hertzian contact model that separates the substrate effect from the thickness-dependent modulus of the film. Interestingly, this correction only depends upon a dimensionless film thickness and the Poisson ratio of the film. To experimentally test this approach, we prepared poly(methyl methacrylate), polystyrene, and parylene films with thicknesses ranging from 20 to 300 nm and studied these films using atomic force microscope-based nanoindenting. Strikingly, when experiments were interpreted using the computationally derived substrate correction, sub-70 nm films were found to be softer than bulk, in agreement with buckling experiments and molecular dynamics studies. This correction can serve as a general method for unambiguously determining the size effect of thin polymer films and ultimately lead to the ability to quantitatively image the mechanical properties of heterogeneous materials such as composites. Published by AIP Publishing.
机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Chung, Peter C.
Green, Peter F.
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Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Chung, Peter C.
Glynos, Emrnanouil
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Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Glynos, Emrnanouil
Green, Peter F.
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Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Chung, Peter C.
Green, Peter F.
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机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Chung, Peter C.
Glynos, Emrnanouil
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机构:
Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA
Glynos, Emrnanouil
Green, Peter F.
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Univ Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Biointerfaces Inst, Ann Arbor, MI 48109 USA