共 67 条
[3]
Critical materials, device design, performance and reliability issues in 4H-SiC power UMOSFET structures
[J].
III-NITRIDE, SIC AND DIAMOND MATERIALS FOR ELECTRONIC DEVICES,
1996, 423
:87-92
[6]
BALIGA BJ, 1987, MODERN POWER DEVICES
[8]
Trapping effects in GaN and SiC microwave FETs
[J].
PROCEEDINGS OF THE IEEE,
2002, 90 (06)
:1048-1058
[9]
BRATCHER M, 1996, P 3 INT HIGH TEMP EL, pP21