Interfacial adhesion between graphene and silicon dioxide by density functional theory with van der Waals corrections

被引:126
作者
Gao, Wei [1 ]
Xiao, Penghao [2 ,3 ]
Henkelman, Graeme [2 ,3 ]
Liechti, Kenneth M. [1 ]
Huang, Rui [1 ]
机构
[1] Univ Texas Austin, Dept Aerosp Engn & Engn Mech, Austin, TX 78712 USA
[2] Univ Texas Austin, Dept Chem, Austin, TX 78712 USA
[3] Univ Texas Austin, Inst Computat & Engn Sci, Austin, TX 78712 USA
基金
美国国家科学基金会;
关键词
graphene; adhesion; silicon dioxide; DFT; van der Waals; MOLECULAR-DYNAMICS; FORCE-FIELD; QUARTZ; ENERGY;
D O I
10.1088/0022-3727/47/25/255301
中图分类号
O59 [应用物理学];
学科分类号
摘要
Interfacial adhesion between graphene and a SiO2 substrate is studied by density functional theory (DFT) with dispersion corrections. The results demonstrate the van der Waals (vdW) interaction as the predominant mechanism at the graphene/SiO2 interface. It is found that the interaction strength is strongly influenced by changes of the SiO2 surface structures due to surface reactions with water. The adhesion energy is reduced when the reconstructed SiO2 surface is hydroxylated, and further reduced when covered by a monolayer of adsorbed water molecules. Moreover, it is noted that vdW forces are required to accurately model the graphene/SiO2 interface with DFT and that the adhesion energy is underestimated by empirical force fields commonly used in atomistic simulations.
引用
收藏
页数:6
相关论文
共 53 条
[1]  
Adamson A.W., 1990, Physical Chemistry of Surfaces
[2]   Effects of mismatch strain and substrate surface corrugation on morphology of supported monolayer graphene [J].
Aitken, Zachary H. ;
Huang, Rui .
JOURNAL OF APPLIED PHYSICS, 2010, 107 (12)
[3]   LATTICE CONSTANTS OF GRAPHITE AT LOW TEMPERATURES [J].
BASKIN, Y ;
MEYER, L .
PHYSICAL REVIEW, 1955, 100 (02) :544-544
[4]   Molecular Dynamics Simulations of Folding of Supported Graphene [J].
Bellido, Edson P. ;
Seminario, Jorge M. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (51) :22472-22477
[5]   PROJECTOR AUGMENTED-WAVE METHOD [J].
BLOCHL, PE .
PHYSICAL REVIEW B, 1994, 50 (24) :17953-17979
[6]   Mechanics of Adhered, Pressurized Graphene Blisters [J].
Boddeti, Narasimha G. ;
Koenig, Steven P. ;
Long, Rong ;
Xiao, Jianliang ;
Bunch, J. Scott ;
Dunn, Martin L. .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 2013, 80 (04)
[7]   Tkatchenko-Scheffler van der Waals correction method with and without self-consistent screening applied to solids [J].
Bucko, Tomas ;
Lebegue, S. ;
Hafner, Juergen ;
Angyan, J. G. .
PHYSICAL REVIEW B, 2013, 87 (06)
[8]   A blister test for interfacial adhesion of large-scale transferred graphene [J].
Cao, Z. ;
Wang, P. ;
Gao, W. ;
Tao, L. ;
Suk, J. W. ;
Ruoff, R. S. ;
Akinwande, D. ;
Huang, R. ;
Liechti, K. M. .
CARBON, 2014, 69 :390-400
[9]   Structure and stability of thin water films on quartz surfaces [J].
Chen, Yun-Wen ;
Cheng, Hai-Ping .
APPLIED PHYSICS LETTERS, 2010, 97 (16)
[10]   Water-silica force field for simulating nanodevices [J].
Cruz-Chu, Eduardo R. ;
Aksimentiev, Aleksei ;
Schulten, Klaus .
JOURNAL OF PHYSICAL CHEMISTRY B, 2006, 110 (43) :21497-21508