Rapid and Highly Compact Purification for Focused Electron Beam Induced Deposits: A Low Temperature Approach Using Electron Stimulated H2O Reactions

被引:98
作者
Geier, Barbara [1 ]
Gspan, Christian [1 ]
Winkler, Robert [1 ]
Schmied, Roland [1 ]
Fowlkes, Jason D. [2 ]
Fitzek, Harald [1 ]
Rauch, Sebastian [4 ]
Rattenberger, Johannes [1 ]
Rack, Philip D. [2 ,3 ]
Plank, Harald [1 ,4 ]
机构
[1] Graz Ctr Electron Microscopy, A-8010 Graz, Austria
[2] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
[3] Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA
[4] Graz Univ Technol, Inst Electron Microscopy & Nanoanal, A-8010 Graz, Austria
基金
美国国家科学基金会;
关键词
REPAIR;
D O I
10.1021/jp503442b
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Focused electron beam induced deposition (FEBID) is an important synthesis method as it is an extremely flexible tool for fabricating functional (3D) structures with nanometer spatial resolution. However, FEBID has historically suffered from carbon impurities up to 90 at %, which significantly limits the intended functionalities. In this study we demonstrate that (MeCpPtMe3)-Me-IV deposits can be fully purified by an electron-beam assisted approach using H2O vapor at room temperature, which eliminates sample and/or gas heating and complicated gas delivery systems, respectively. We demonstrate that local pressures of 10 Pa results in an electron-limited regime, thus enabling high purification rates of better than 5 min.nA(-1) mu m(-2) (30 C.cm(-2)) for initially 150 nm thick deposits. Furthermore, TEM measurements suggest the purification process for the highly compact deposits occurs via a bottom-up process.
引用
收藏
页码:14009 / 14016
页数:8
相关论文
共 41 条
  • [1] Purification of platinum and gold structures after electron-beam-induced deposition
    Botman, A.
    Mulders, J. J. L.
    Weemaes, R.
    Mentink, S.
    [J]. NANOTECHNOLOGY, 2006, 17 (15) : 3779 - 3785
  • [2] Creating pure nanostructures from electron-beam-induced deposition using purification techniques: a technology perspective
    Botman, A.
    Mulders, J. J. L.
    Hagen, C. W.
    [J]. NANOTECHNOLOGY, 2009, 20 (37)
  • [3] High-purity cobalt nanostructures grown by focused-electron-beam-induced deposition at low current
    Cordoba, R.
    Sese, J.
    De Teresa, J. M.
    Ibarra, M. R.
    [J]. MICROELECTRONIC ENGINEERING, 2010, 87 (5-8) : 1550 - 1553
  • [4] CASINO V2.42 - A fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users
    Drouin, Dominique
    Couture, Alexandre Real
    Joly, Dany
    Tastet, Xavier
    Aimez, Vincent
    Gauvin, Raynald
    [J]. SCANNING, 2007, 29 (03) : 92 - 101
  • [5] Electron-beam-based photomask repair
    Edinger, K
    Becht, H
    Bihr, J
    Boegli, V
    Budach, M
    Hofmann, T
    Koops, HWP
    Kuschnerus, P
    Oster, J
    Spies, P
    Weyrauch, B
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 2902 - 2906
  • [6] Fernandez-Pacheco A., 2009, PHYS REV B, V79, P1, DOI DOI 10.1103/PHYSREVB.79.174204
  • [7] Fernandez-Pacheco A., 2009, APPL PHYS LETT, V94, P1
  • [8] Fabrication by electron beam induced deposition and transmission electron microscopic characterization of sub-10-nm freestanding Pt nanowires
    Frabboni, S.
    Gazzadi, G. C.
    Felisari, L.
    Spessot, A.
    [J]. APPLIED PHYSICS LETTERS, 2006, 88 (21)
  • [9] Granular Co-C nano-Hall sensors by focused-beam-induced deposition
    Gabureac, Mihai
    Bernau, Laurent
    Utke, Ivo
    Boero, Giovanni
    [J]. NANOTECHNOLOGY, 2010, 21 (11)
  • [10] Single Superparamagnetic Bead Detection and Direct Tracing of Bead Position Using Novel Nanocomposite Nano-Hall Sensors
    Gabureac, Mihai S.
    Bernau, Laurent
    Boero, Giovanni
    Utke, Ivo
    [J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2013, 12 (05) : 668 - 673