In this paper, structural, optical and electrical characterizations of longwave infrared barrier detectors based on the InAs/GaSb superlattice are reported and analyzed. The fabricated detectors exhibited a 50% cut-off wavelength around 10.5 mu m at 80K measured by photoluminescence and spectral response. The dark current density was 8.4x 10(-4) A/cm(-2) at 80K and a performance analysis combining spectral response, dark current-voltage characteristic and capacitance-voltage measurement curves was performed to determine the operating bias and the dark current regimes at different biases. Dark current simulations were also performed to better understand limiting dark current mechanisms of the device performance. (c) 2019 Author(s).
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
;
Metcalfe, Grace D.
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
;
Shen, Hongen
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
;
Wraback, Michael
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
;
Metcalfe, Grace D.
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
;
Shen, Hongen
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
;
Wraback, Michael
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA