Testing static and dynamic faults in random access memories

被引：82

作者：

Hamdioui, S ^{[1
]}

Al-Ars, Z ^{[1
]}

van de Goor, AJ ^{[1
]}

机构：

[1] Intel Corp, Santa Clara, CA 95052 USA

来源：

20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2002年

关键词：

static faults; dynamic faults; fault primitives; memory tests; fault coverage;

D O I：

10.1109/VTS.2002.1011170

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored any more. It will be shown in this paper that conventional memory tests constructed to detect the static faulty behavior of a specific defect do not necessarily, detect its dynamic faulty behavior; which has been shown to exist. The dynamic fault behavior can take place in the absence of the static fault behavior. The paper therefore also presents new memory tests derived to target the dynamic fault class.

引用

页码：395 / 400

页数：6

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