Application of microwave spectroscopy to studies of electron transport properties

被引：4

作者：

Wolos, Agnieszka ^{[1
,2
]}

Drabinska, Aneta ^{[2
]}

机构：

[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

[2] Univ Warsaw, Fac Phys, PL-00681 Warsaw, Poland

来源：

JOURNAL OF CRYSTAL GROWTH | 2014年 / 401卷

关键词：

Characterization; Low dimensional structures; Nitrides; Graphene; Bismuth compounds; SINGLE QUANTUM-WELLS; CYCLOTRON-RESONANCE; LOCALIZATION;

D O I：

10.1016/j.jcrysgro.2013.11.040

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Application of microwave detection to studies of electron transport properties in novel crystalline materials is presented. Using conventional electron paramagnetic resonance spectrometer, we investigate edge magnetoplasma resonance and Shubnikov-de Haas oscillations in GaN/AlxGa1-xN heterostructures, quantum interference phenomena (weak localization and antilocalization) in GaN/AlxGa1-xN heterostructures, epitaxial graphene and Bi2Te2Se topological insulator, and the cyclotron resonance in Bi2Te3 topological insulator. The detection technique and conditions that must be met by samples, as well as advantages of the method of characterization are discussed. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：314 / 318

页数：5

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