Modeling adhesive force distributions on highly rough surfaces

被引:12
作者
Fritzsche, Joerg [1 ]
Peuker, Urs Alexander [1 ]
机构
[1] TU Freiberg, Inst Mech Proc Engn & Mineral Proc, Agricolastr 1, D-09599 Freiberg, Germany
关键词
Atomic force microscopy; Colloidal probe technique; Van der Waals force; Hydrophobic force; Force distribution; HAMAKER CONSTANTS; PARTICLE ADHESION; LIFSHITZ THEORY; FILTRATION; AGGLOMERATION; MICROSCOPY; MECHANISMS; HYDRATION; WATER;
D O I
10.1016/j.powtec.2015.11.057
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Adhesive forces between particles have a major impact on many processes. The calculation of these forces is possible in the case of ideal smooth surfaces. Nevertheless real surfaces are rough which typically leads to decreased forces. Furthermore the forces are distributed over several orders of magnitude. In the presented paper, a new model to calculate the force distributions is developed. The model is based on surface roughness parameters which can be measured by atomic force microscopy. It is valid for van der Waals forces as well as for hydrophobic forces. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:88 / 94
页数:7
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