High-resolution three-dimensional imaging of dislocations

被引：120
|
作者：
Barnard, J. S. [1 ]
Sharp, J. [1 ]
Tong, J. R. [1 ]
Midgley, P. A. [1 ]
机构：
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
来源：
SCIENCE | 2006年 / 313卷 / 5785期
关键词：
D O I：
10.1126/science.1125783
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.
引用
收藏
页码：319 / 319
页数：1
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