Machine learning supported analysis of MOVPE grown β-Ga2O3 thin films on sapphire

被引:13
作者
Chou, Ta-Shun [1 ]
Bin Anooz, Saud [1 ]
Grueneberg, Raimund [1 ]
Dropka, Natasha [1 ]
Miller, Wolfram [1 ]
Tran, Thi Thuy Vi [1 ]
Rehm, Jana [1 ]
Albrecht, Martin [1 ]
Popp, Andreas [1 ]
机构
[1] Leibniz Inst Kristallzuchtung IKZ, Max Born Str 2, D-12489 Berlin, Germany
关键词
Computer simulation; Metalorganic vapor phase epitaxy; Gallium compounds; Oxides; NEURAL-NETWORKS; GAS-PHASE; OPTIMIZATION; LAYERS; TRIETHYLGALLIUM; DECOMPOSITION; SURFACE; MODEL;
D O I
10.1016/j.jcrysgro.2022.126737
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this work, we demonstrate a machine learning approach, Random Forest, for the beta-Ga2O3 growth rate prediction in the metal-organic vapor phase epitaxy (MOVPE) by analyzing the growth process of beta-Ga2O3 on sapphire optically. The proposed model can assess the complex non-linear dependencies among the growth parameters and optimize them for the optimal growth rate. The model based on the process parameters (e.g., precursor concentration, chamber pressure, and push gas) provides high predictive power, reaching the coefficient of determination (R-2) of 0.95 and 0.92 for the training and testing sets. The outcome of the model is applicable to both homoepitaxial and heteroepitaxial processes and on different substrate orientations.
引用
收藏
页数:9
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