The geometric phase analysis method based on the local high resolution discrete Fourier transform for deformation measurement

被引:23
作者
Dai, Xianglu [1 ]
Xie, Huimin [1 ]
Wang, Huaixi [1 ]
Li, Chuanwei [1 ]
Liu, Zhanwei [2 ]
Wu, Lifu [1 ]
机构
[1] Tsinghua Univ, Dept Engn Mech, AML, Beijing 100084, Peoples R China
[2] Beijing Inst Technol, Sch Aerosp Engn, Beijing 100081, Peoples R China
基金
中国国家自然科学基金;
关键词
LHR-DFT GPA; GPA; discrete Fourier transform; fundamental frequency; FRINGE-PATTERN-ANALYSIS; STRAIN; FABRICATION; IMAGES; FIELDS;
D O I
10.1088/0957-0233/25/2/025402
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The geometric phase analysis (GPA) method based on the local high resolution discrete Fourier transform (LHR-DFT) for deformation measurement, defined as LHR-DFT GPA, is proposed to improve the measurement accuracy. In the general GPA method, the fundamental frequency of the image plays a crucial role. However, the fast Fourier transform, which is generally employed in the general GPA method, could make it difficult to locate the fundamental frequency accurately when the fundamental frequency is not located at an integer pixel position in the Fourier spectrum. This study focuses on this issue and presents a LHR-DFT algorithm that can locate the fundamental frequency with sub-pixel precision in a specific frequency region for the GPA method. An error analysis is offered and simulation is conducted to verify the effectiveness of the proposed method; both results show that the LHR-DFT algorithm can accurately locate the fundamental frequency and improve the measurement accuracy of the GPA method. Furthermore, typical tensile and bending tests are carried out and the experimental results verify the effectiveness of the proposed method.
引用
收藏
页数:8
相关论文
共 30 条
[1]  
Bone D J, 1986, APPL OPT
[2]   Practical and Reproducible Mapping of Strains in Si Devices Using Geometric Phase Analysis of Annular Dark-Field Images From Scanning Transmission Electron Microscopy [J].
Chung, Jayhoon ;
Lian, Guoda ;
Rabenberg, Lew .
IEEE ELECTRON DEVICE LETTERS, 2010, 31 (08) :854-856
[3]   Three frames phase-shifting shadow moire using arbitrary unknown phase steps [J].
Du, Hubing ;
Zhao, Hong ;
Li, Bing ;
Zhao, Jinlei ;
Cao, Shixun .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (10)
[4]   Real-time 2D parallel windowed Fourier transform for fringe pattern analysis using Graphics Processing Unit [J].
Gao, Wenjing ;
Huyen, Nguyen Thi Thanh ;
Loi, Ho Sy ;
Kemao, Qian .
OPTICS EXPRESS, 2009, 17 (25) :23147-23152
[5]   Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry [J].
Huang, Lei ;
Kemao, Qian ;
Pan, Bing ;
Asundi, Anand Krishna .
OPTICS AND LASERS IN ENGINEERING, 2010, 48 (02) :141-148
[6]   Stress and strain around grain-boundary dislocations measured by high-resolution electron microscopy [J].
Hytch, M. J. ;
Putaux, J. -L. ;
Thibault, J. .
PHILOSOPHICAL MAGAZINE, 2006, 86 (29-31) :4641-4656
[7]  
Hytch MJ, 1997, PHILOS MAG A, V76, P1119, DOI 10.1080/01418619708214218
[8]   Quantitative measurement of displacement and strain fields from HREM micrographs [J].
Hytch, MJ ;
Snoeck, E ;
Kilaas, R .
ULTRAMICROSCOPY, 1998, 74 (03) :131-146
[9]   Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy [J].
Hytch, MJ ;
Putaux, JL ;
Pénisson, JM .
NATURE, 2003, 423 (6937) :270-273
[10]   Geometric phase analysis of lattice images from algal cellulose microfibrils [J].
Imai, T ;
Putaux, JL ;
Sugiyama, J .
POLYMER, 2003, 44 (06) :1871-1879