On improving the radiation resistance of gallium oxide for space applications

被引:29
作者
Bauman, D. A. [1 ]
Borodkin, A., I [1 ]
Petrenko, A. A. [1 ]
Panov, D., I [1 ]
Kremleva, A., V [1 ]
Spiridonov, V. A. [1 ]
Zakgeim, D. A. [1 ,2 ]
Silnikov, M., V [3 ]
Odnoblyudov, M. A. [1 ]
Romanov, A. E. [1 ,2 ]
Bougrov, V. E. [1 ]
机构
[1] ITMO Univ, St Petersburg 197101, Russia
[2] Ioffe Phys Tech Inst RAS, St Petersburg 194021, Russia
[3] Special Mat Corp, St Petersburg 194044, Russia
基金
俄罗斯科学基金会;
关键词
Radiation resistance; Space applications; Gallium oxide; Czochralski method; Crystal growth; SOLAR-BLIND PHOTODETECTORS; SAFETY; IRRADIATION;
D O I
10.1016/j.actaastro.2020.12.010
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
A method is proposed for increasing the radiation resistance of semiconductor crystals (AlxGa1-x)(2)O-3, which are promising for creating power electronics and optoelectronic devices for spacecraft performing tasks in near-earth orbits. The effect of the aluminum content on the bandgap in (AlxGa1-x)(2)O-3 single crystals grown from a melt by the Czochralski method is investigated. The necessary conditions for the formation of a high-quality seed and subsequent growth of single crystals are achieved by setting temperature gradients at each successive stage of growth. The results of energy-dispersive X-ray spectroscopy analysis and optical transmission spectra of (AlxGa1-x)(2)O-3 crystals with an aluminum content from 0 to 7.32% are presented. It is shown that an increase in the aluminum content leads to a monotonic increase in the bandgap from 4.7 eV to 5.0 eV, which provides an increase in radiation resistance.
引用
收藏
页码:125 / 129
页数:5
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