Powder diffraction data and Rietveld refinement of metastable t-ZrO2 at low temperature

被引：87

作者：

Malek, J

Benes, L

Mitsuhashi, T

机构：

[1] UNIV PARDUBICE, PARDUBICE 53009, CZECH REPUBLIC

[2] NATL INST RES INORGAN MAT, TSUKUBA, IBARAKI 305, JAPAN

来源：

POWDER DIFFRACTION | 1997年 / 12卷 / 02期

关键词：

D O I：

10.1017/S0885715600009519

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Indexed X-ray powder diffraction data are reported for the low temperature tetragonal ZrO2 obtained by crystallization of zirconia gel. The structure was refined by the Rietveld technique on the basis of space group P4(2)/nmc. Refined unit cell dimensions are a = 3.5984(5) Angstrom, c = 5.152(1) Angstrom, V = 66.71 Angstrom(3), D-x = 6.135 g/cm(3), F-18 = 62 (0.012, 24), Rp = 8.99, R-wp = 11.48, R-B = 3.13. (C) 1997 International Centre for Diffraction Data.

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页码：96 / 98

页数：3

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