Improved atomic force microscope

被引：0
|
作者：
Eroshenko, Yu N.
机构：
来源：
PHYSICS-USPEKHI | 2009年 / 52卷 / 10期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1081 / 1081
页数：1
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