Charge Transport in Deep and Shallow States in a High-Mobility Polymer FET

被引:10
|
作者
Kim, Seohee [1 ]
Ha, Tae-Jun [2 ]
Sonar, Prashant [3 ]
Dodabalapur, Ananth [1 ]
机构
[1] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78758 USA
[2] KwangWoon Univ, Dept Elect Mat Engn, Seoul 130701, South Korea
[3] Queensland Univ Technol, Sch Chem Phys & Mech Engn, Brisbane, Qld 4001, Australia
基金
美国国家科学基金会;
关键词
Charge transport; drift limited; modeling; polymer FET; subthreshold; THIN-FILM TRANSISTORS; FIELD-EFFECT TRANSISTORS; SEMICONDUCTING POLYMERS; ORGANIC SEMICONDUCTORS; ELECTRONIC TRANSPORT; CONJUGATED POLYMERS; DISORDER; MODEL;
D O I
10.1109/TED.2016.2521663
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Polymer FETs generally have a wide subthreshold regime due to a lot of disorder, mainly originated from domain/grain boundaries. Deep state's charge transport of polymer transistors has not been investigated due to the difficulty in determining the field-effect mobility in the subthreshold region. In this paper, the features of the charge transport in deep and shallow states of polymer transistors will be discussed in detail through an accurate modeling and an analysis of subthreshold behavior in transistors. Charge transport in shallow states can be described by multiple trap and release transport, while hopping transport models, such as variable range hopping or Gaussian disorder-based model, describe well the deeper state's charge transport. In addition, the transition between the conduction regimes is a function of temperature and carrier density.
引用
收藏
页码:1254 / 1259
页数:6
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